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Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology

contributor authorImtiaz, Al
contributor authorWallis, T.M.
contributor authorKabos, P.
date accessioned2020-03-12T18:41:42Z
date available2020-03-12T18:41:42Z
date issued2014
identifier issn1527-3342
identifier other6717071.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/967145?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleNear-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology
typeJournal Paper
contenttypeMetadata Only
identifier padid8001076
subject keywordsDNA
subject keywordsatomic force microscopy
subject keywordsnanotechnology
subject keywordsoptical microscopes
subject keywordsquantum theory
subject keywordsscanning electron microscopy
subject keywordsscanning tunnelling microscopy
subject keywordsAFM
subject keywordsDNA molecules
subject keywordsNSOM
subject keywordsSEM
subject keywordsSTM
subject keywordsatomic force microscope
subject keywordsatomic-scale device
subject keywordsatomic-scale manipulation
subject keywordsmolecular-scale device
subject keywordsnanoscale metrology
subject keywordsnanoscience
subject keywordsnanotechnology
subject keywordsnear-field scanning microwave microscopy
subject keywordsnear-field scanning optical microscope
subject keywordsquantum mechanics
subject keywordsscanning electron microscope
subject keywordsscanning tunneling microscope
subject keywordsFrequency
identifier doi10.1109/MMM.2013.2288711
journal titleMicrowave Magazine, IEEE
journal volume15
journal issue1
filesize3210054
citations0


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