Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology
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Year
: 2014DOI: 10.1109/MMM.2013.2288711
Keyword(s): DNA,atomic force microscopy,nanotechnology,optical microscopes,quantum theory,scanning electron microscopy,scanning tunnelling microscopy,AFM,DNA molecules,NSOM,SEM,STM,atomic force microscope,atomic-scale device,atomic-scale manipulation,molecular-scale device,nanoscale metrology,nanoscience,nanotechnology,near-field scanning microwave microscopy,near-field scanning optical microscope,quantum mechanics,scanning electron microscope,scanning tunneling microscope,Frequency
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Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology
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| contributor author | Imtiaz, Al | |
| contributor author | Wallis, T.M. | |
| contributor author | Kabos, P. | |
| date accessioned | 2020-03-12T18:41:42Z | |
| date available | 2020-03-12T18:41:42Z | |
| date issued | 2014 | |
| identifier issn | 1527-3342 | |
| identifier other | 6717071.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/967145?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8001076 | |
| subject keywords | DNA | |
| subject keywords | atomic force microscopy | |
| subject keywords | nanotechnology | |
| subject keywords | optical microscopes | |
| subject keywords | quantum theory | |
| subject keywords | scanning electron microscopy | |
| subject keywords | scanning tunnelling microscopy | |
| subject keywords | AFM | |
| subject keywords | DNA molecules | |
| subject keywords | NSOM | |
| subject keywords | SEM | |
| subject keywords | STM | |
| subject keywords | atomic force microscope | |
| subject keywords | atomic-scale device | |
| subject keywords | atomic-scale manipulation | |
| subject keywords | molecular-scale device | |
| subject keywords | nanoscale metrology | |
| subject keywords | nanoscience | |
| subject keywords | nanotechnology | |
| subject keywords | near-field scanning microwave microscopy | |
| subject keywords | near-field scanning optical microscope | |
| subject keywords | quantum mechanics | |
| subject keywords | scanning electron microscope | |
| subject keywords | scanning tunneling microscope | |
| subject keywords | Frequency | |
| identifier doi | 10.1109/MMM.2013.2288711 | |
| journal title | Microwave Magazine, IEEE | |
| journal volume | 15 | |
| journal issue | 1 | |
| filesize | 3210054 | |
| citations | 0 |