Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon
Publisher:
Year
: 2014DOI: 10.1109/JPHOTOV.2013.2293062
Keyword(s): carrier density,carrier lifetime,electrical resistivity,elemental semiconductors,phosphorus,photoconductivity,silicon,Si:P,camera signal,charge-carrier density,dynamic ILM technique,dynamic infrared lifetime mapping,highly doped regions,injection dependent lifetimes,modulated sample temperature,phosphorous diffused samples,photo-conductance decay measurements,saturation current density measurement,sheet resistances,textured samples,Cameras,Charge carriers,Density measuremen
Collections
:
-
Statistics
Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon
Show full item record
| contributor author | Muller, Johannes | |
| contributor author | Hannebauer, Helge | |
| contributor author | Mader, Christoph | |
| contributor author | Haase, Frerk | |
| contributor author | Bothe, Klaus | |
| date accessioned | 2020-03-12T18:35:34Z | |
| date available | 2020-03-12T18:35:34Z | |
| date issued | 2014 | |
| identifier issn | 2156-3381 | |
| identifier other | 6680662.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/963639?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7996985 | |
| subject keywords | carrier density | |
| subject keywords | carrier lifetime | |
| subject keywords | electrical resistivity | |
| subject keywords | elemental semiconductors | |
| subject keywords | phosphorus | |
| subject keywords | photoconductivity | |
| subject keywords | silicon | |
| subject keywords | Si:P | |
| subject keywords | camera signal | |
| subject keywords | charge-carrier density | |
| subject keywords | dynamic ILM technique | |
| subject keywords | dynamic infrared lifetime mapping | |
| subject keywords | highly doped regions | |
| subject keywords | injection dependent lifetimes | |
| subject keywords | modulated sample temperature | |
| subject keywords | phosphorous diffused samples | |
| subject keywords | photo-conductance decay measurements | |
| subject keywords | saturation current density measurement | |
| subject keywords | sheet resistances | |
| subject keywords | textured samples | |
| subject keywords | Cameras | |
| subject keywords | Charge carriers | |
| subject keywords | Density measuremen | |
| identifier doi | 10.1109/JPHOTOV.2013.2293062 | |
| journal title | Photovoltaics, IEEE Journal of | |
| journal volume | 4 | |
| journal issue | 2 | |
| filesize | 702991 | |
| citations | 0 |