Potentiometric Titration of <formula formulatype="inline"> <img src="/images/tex/21267.gif" alt="{\\rm NH}_{4}{\\rm VO}_{3}"> </formula> and <formula formulatype="inline"> <img src="/images/tex/21268.gif" alt="{\\rm Na}_{2}{\\rm HAsO}_{4}"> </formula> in Molten <formula formulatype="inline"> <img src="/images/tex/21269.gif" alt="{\\rm NaNO}

Author:

Ghalwa, Nasser Abu

Publisher:

IEEE

Year

: 2014

DOI: 10.1109/JSEN.2013.2285673

URI: https://libsearch.um.ac.ir:443/fum/handle/fum/960701

Keyword(s): ammonium compounds,catalysis,electrochemical electrodes,electrochemical sensors,glass,niobium compounds,pH measurement,sodium compounds,sol-gel processing,thin film sensors,thin films,NH<,sub>,4<,/sub>,VO<,sub>,3<,/sub>,Na<,sub>,2<,/sub>,HAsO<,sub>,4<,/sub>,SiO<,sub>,2<,/sub>,-Nb<,sub>,2<,/sub>,O<,sub>,5<,/sub>,potentiometric titration,sol-gel process,solid state glass-Nb<,sub>,2<,/sub>,O<,sub>,5<,/sub>,p

Collections :

Latin Articles

Show Full MetaData Hide Full MetaData
Statistics

Potentiometric Titration of <formula formulatype="inline"> <img src="/images/tex/21267.gif" alt="{\\rm NH}_{4}{\\rm VO}_{3}"> </formula> and <formula formulatype="inline"> <img src="/images/tex/21268.gif" alt="{\\rm Na}_{2}{\\rm HAsO}_{4}"> </formula> in Molten <formula formulatype="inline"> <img src="/images/tex/21269.gif" alt="{\\rm NaNO}_{3}"> </formula&

Show full item record

contributor author	Ghalwa, Nasser Abu
date accessioned	2020-03-12T18:30:15Z
date available	2020-03-12T18:30:15Z
date issued	2014
identifier issn	1530-437X
identifier other	6636055.pdf
identifier uri	https://libsearch.um.ac.ir:443/fum/handle/fum/960701
format	general
language	English
publisher	IEEE
title	Potentiometric Titration of <formula formulatype="inline"> <img src="/images/tex/21267.gif" alt="{\\rm NH}_{4}{\\rm VO}_{3}"> </formula> and <formula formulatype="inline"> <img src="/images/tex/21268.gif" alt="{\\rm Na}_{2}{\\rm HAsO}_{4}"> </formula> in Molten <formula formulatype="inline"> <img src="/images/tex/21269.gif" alt="{\\rm NaNO}_{3}"> </formula&
type	Journal Paper
contenttype	Metadata Only
identifier padid	7993395
subject keywords	ammonium compounds
subject keywords	catalysis
subject keywords	electrochemical electrodes
subject keywords	electrochemical sensors
subject keywords	glass
subject keywords	niobium compounds
subject keywords	pH measurement
subject keywords	sodium compounds
subject keywords	sol-gel processing
subject keywords	thin film sensors
subject keywords	thin films
subject keywords	NH<
subject keywords	sub>
subject keywords	4<
subject keywords	/sub>
subject keywords	VO<
subject keywords	sub>
subject keywords	3<
subject keywords	/sub>
subject keywords	Na<
subject keywords	sub>
subject keywords	2<
subject keywords	/sub>
subject keywords	HAsO<
subject keywords	sub>
subject keywords	4<
subject keywords	/sub>
subject keywords	SiO<
subject keywords	sub>
subject keywords	2<
subject keywords	/sub>
subject keywords	-Nb<
subject keywords	sub>
subject keywords	2<
subject keywords	/sub>
subject keywords	O<
subject keywords	sub>
subject keywords	5<
subject keywords	/sub>
subject keywords	potentiometric titration
subject keywords	sol-gel process
subject keywords	solid state glass-Nb<
subject keywords	sub>
subject keywords	2<
subject keywords	/sub>
subject keywords	O<
subject keywords	sub>
subject keywords	5<
subject keywords	/sub>
subject keywords	p
identifier doi	10.1109/JSEN.2013.2285673
journal title	Sensors Journal, IEEE
journal volume	14
journal issue	2
filesize	855868
citations	0

Author:

Publisher:

Year

DOI: 10.1109/JSEN.2013.2285673

Show full item record

Related items

A CMOS Temperature Sensor With a Voltage-Calibrated Inaccuracy of $\\pm$ 0.15$ ^{\\circ}$ C (3$\\sigma$ ) From $-$ 55$^{\\circ}$ C to 125 ﻿

Joint Reliability Importance in a Consecutive- $k$ -out-of-$n$ :F System and an $m$-Consecutive- $k$-out-of-$n$:F System for Markov-Dependent Components ﻿

An Embedded 65 nm CMOS Remote Temperature Sensor With Digital Beta Correction and Series Resistance Cancellation Achieving an Inaccuracy of 0.4$^{\\circ}$C (3$\\sigma$ ) From $-$ 40$^{\\circ}$ C to 130 ﻿

A CMOS Temperature Sensor With a Voltage-Calibrated Inaccuracy of $\\pm$ 0.15$ ^{\\circ}$ C (3$\\sigma$ ) From $-$ 55$^{\\circ}$ C to 125

Joint Reliability Importance in a Consecutive- $k$ -out-of-$n$ :F System and an $m$-Consecutive- $k$-out-of-$n$:F System for Markov-Dependent Components

An Embedded 65 nm CMOS Remote Temperature Sensor With Digital Beta Correction and Series Resistance Cancellation Achieving an Inaccuracy of 0.4$^{\\circ}$C (3$\\sigma$ ) From $-$ 40$^{\\circ}$ C to 130