•  English
    • Persian
    • English
  •   Login
  • Ferdowsi University of Mashhad
  • |
  • Information Center and Central Library
    • Persian
    • English
  • Home
  • Source Types
    • Journal Paper
    • Ebook
    • Conference Paper
    • Standard
    • Protocol
    • Thesis
  • Use Help
View Item 
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  • All Fields
  • Title
  • Author
  • Year
  • Publisher
  • Subject
  • Publication Title
  • ISSN
  • DOI
  • ISBN
Advanced Search
JavaScript is disabled for your browser. Some features of this site may not work without it.

MIHST: A Hardware Technique for Embedded Microprocessor Functional On-Line Self-Test

Author:
Bernardi, P.
,
Ciganda, Lyl Mercedes
,
Sanchez, E.
,
Reorda, M. Sonza
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/TC.2013.165
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/958591
Keyword(s): built-in self test,microprocessor chips,system-on-chip,BIST,MIHST,SBST-like test sequence,SoC,embedded microprocessor,functional online self-test,hardware technique,intellectual property,microprocessor hardware self-test,pipelined processor,system-on-chip,Built-in self-test,Embedded systems,Memory management,Microprocessors,Process control,System-on-chip,Microprocessor testing,SBST,functional testing,on-line testing
Collections :
  • Latin Articles
  • Show Full MetaData Hide Full MetaData
  • Statistics

    MIHST: A Hardware Technique for Embedded Microprocessor Functional On-Line Self-Test

Show full item record

contributor authorBernardi, P.
contributor authorCiganda, Lyl Mercedes
contributor authorSanchez, E.
contributor authorReorda, M. Sonza
date accessioned2020-03-12T18:26:27Z
date available2020-03-12T18:26:27Z
date issued2014
identifier issn0018-9340
identifier other6579592.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/958591?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleMIHST: A Hardware Technique for Embedded Microprocessor Functional On-Line Self-Test
typeJournal Paper
contenttypeMetadata Only
identifier padid7991057
subject keywordsbuilt-in self test
subject keywordsmicroprocessor chips
subject keywordssystem-on-chip
subject keywordsBIST
subject keywordsMIHST
subject keywordsSBST-like test sequence
subject keywordsSoC
subject keywordsembedded microprocessor
subject keywordsfunctional online self-test
subject keywordshardware technique
subject keywordsintellectual property
subject keywordsmicroprocessor hardware self-test
subject keywordspipelined processor
subject keywordssystem-on-chip
subject keywordsBuilt-in self-test
subject keywordsEmbedded systems
subject keywordsMemory management
subject keywordsMicroprocessors
subject keywordsProcess control
subject keywordsSystem-on-chip
subject keywordsMicroprocessor testing
subject keywordsSBST
subject keywordsfunctional testing
subject keywordson-line testing
identifier doi10.1109/TC.2013.165
journal titleComputers, IEEE Transactions on
journal volume63
journal issue11
filesize1821461
citations0
  • About Us
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
DSpace software copyright © 2019-2022  DuraSpace