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An Experimental Evaluation of SiC Switches in Soft-Switching Converters

Author:
Ranstad, Per
,
Nee, H.-P.
,
Linner, J.
,
Peftitsis, Dimosthenis
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/TPEL.2013.2265380
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/957402
Keyword(s): calorimetry,insulated gate bipolar transistors,power semiconductor switches,silicon compounds,zero current switching,zero voltage switching,IGBT,SiC,calorimetric approach,conductivity modulation lag,dynamic conduction losses,frequency 200 kHz,gate/base driver point-of-view,insulated gate bipolar transistors,silicon carbide transistors,sinusoidal current,soft-switching converter test system,vertical trench junction field-effect transistor,Bipolar junction transistor (BJT),condu
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    An Experimental Evaluation of SiC Switches in Soft-Switching Converters

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contributor authorRanstad, Per
contributor authorNee, H.-P.
contributor authorLinner, J.
contributor authorPeftitsis, Dimosthenis
date accessioned2020-03-12T18:24:23Z
date available2020-03-12T18:24:23Z
date issued2014
identifier issn0885-8993
identifier other6544271.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/957402?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleAn Experimental Evaluation of SiC Switches in Soft-Switching Converters
typeJournal Paper
contenttypeMetadata Only
identifier padid7989654
subject keywordscalorimetry
subject keywordsinsulated gate bipolar transistors
subject keywordspower semiconductor switches
subject keywordssilicon compounds
subject keywordszero current switching
subject keywordszero voltage switching
subject keywordsIGBT
subject keywordsSiC
subject keywordscalorimetric approach
subject keywordsconductivity modulation lag
subject keywordsdynamic conduction losses
subject keywordsfrequency 200 kHz
subject keywordsgate/base driver point-of-view
subject keywordsinsulated gate bipolar transistors
subject keywordssilicon carbide transistors
subject keywordssinusoidal current
subject keywordssoft-switching converter test system
subject keywordsvertical trench junction field-effect transistor
subject keywordsBipolar junction transistor (BJT)
subject keywordscondu
identifier doi10.1109/TPEL.2013.2265380
journal titlePower Electronics, IEEE Transactions on
journal volume29
journal issue5
filesize888248
citations1
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