Reliability-Oriented Placement and Routing Algorithm for SRAM-Based FPGAs
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سال
: 2014شناسه الکترونیک: 10.1109/TVLSI.2013.2239318
کلیدواژه(گان): SRAM chips,field programmable gate arrays,integrated circuit reliability,integrated logic circuits,nanoelectronics,network routing,probability,radiation hardening (electronics),SRAM-based FPGAs,cube-based analysis algorithm,error propagation probability,fault occurrence probability,nanometer scale,node error rate,reliability-oriented placement,routing algorithm,soft error mitigation,system-level robustness,Circuit faults,Field programmable gate arrays,Integrated circuit relia
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Reliability-Oriented Placement and Routing Algorithm for SRAM-Based FPGAs
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| contributor author | Keheng Huang | |
| contributor author | Yu Hu | |
| contributor author | Xiaowei Li | |
| date accessioned | 2020-03-12T18:21:38Z | |
| date available | 2020-03-12T18:21:38Z | |
| date issued | 2014 | |
| identifier issn | 1063-8210 | |
| identifier other | 6459610.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/955859?locale-attribute=fa | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Reliability-Oriented Placement and Routing Algorithm for SRAM-Based FPGAs | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7987660 | |
| subject keywords | SRAM chips | |
| subject keywords | field programmable gate arrays | |
| subject keywords | integrated circuit reliability | |
| subject keywords | integrated logic circuits | |
| subject keywords | nanoelectronics | |
| subject keywords | network routing | |
| subject keywords | probability | |
| subject keywords | radiation hardening (electronics) | |
| subject keywords | SRAM-based FPGAs | |
| subject keywords | cube-based analysis algorithm | |
| subject keywords | error propagation probability | |
| subject keywords | fault occurrence probability | |
| subject keywords | nanometer scale | |
| subject keywords | node error rate | |
| subject keywords | reliability-oriented placement | |
| subject keywords | routing algorithm | |
| subject keywords | soft error mitigation | |
| subject keywords | system-level robustness | |
| subject keywords | Circuit faults | |
| subject keywords | Field programmable gate arrays | |
| subject keywords | Integrated circuit relia | |
| identifier doi | 10.1109/TVLSI.2013.2239318 | |
| journal title | Very Large Scale Integration (VLSI) Systems, IEEE Transactions on | |
| journal volume | 22 | |
| journal issue | 2 | |
| filesize | 1468816 | |
| citations | 2 |