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Goodness of fit testing for accident models with low means

Author:
Ye, Zhirui - Zhang, Yunlong - Lord, Dominique
Publisher:
Elsevier Science
Year
: 2013
DOI: 10.1016/j.aap.2012.11.007
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/577275
Keyword(s): Low sample mean crash data,Generalized linear model,Goodness,Power
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    Goodness of fit testing for accident models with low means

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contributor authorYe, Zhirui - Zhang, Yunlong - Lord, Dominique
date accessioned2020-03-11T15:32:18Z
date available2020-03-11T15:32:18Z
date issued2013
identifier issn0001-4575
identifier other10.1016-j.aap.2012.11.007.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/577275?locale-attribute=en
formatgeneral
languageEnglish
publisherElsevier Science
titleGoodness of fit testing for accident models with low means
typeJournal Paper
contenttypeMetadata Only
identifier padid4430411
subject keywordsLow sample mean crash data
subject keywordsGeneralized linear model
subject keywordsGoodness
subject keywordsPower
identifier doi10.1016/j.aap.2012.11.007
journal titleAccident Analysis and Prevention
journal volume61
journal issue0
filesize555069
citations0
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