Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM
| contributor author | Wang Kang | |
| contributor author | Liuyang Zhang | |
| contributor author | Weisheng Zhao | |
| contributor author | Jacques-Olivier Klein | |
| contributor author | Youguang Zhang | |
| contributor author | Dafine Ravelosona | |
| contributor author | Claude Chappert | |
| date accessioned | 2020-03-13T05:05:45Z | |
| date available | 2020-03-13T05:05:45Z | |
| date issued | 2015 | |
| identifier other | tG38s9xPDS9Svts88yreLhA5nzJoSawWXeArZrDzvKflBGpYFX.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1213411?locale-attribute=fa&show=full | |
| format | general | |
| language | English | |
| title | Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM | |
| type | Journal Paper | |
| contenttype | Fulltext | |
| contenttype | Fulltext | |
| identifier padid | 8798354 | |
| identifier doi | 10.1109/JETCAS.2014.2374291 | |
| journal title | IEEE Journal on Emerging and Selected Topics in Circuits and Systems | |
| coverage | Academic | |
| pages | 28-39 | |
| journal volume | 5 | |
| journal issue | 1 | |
| filesize | 2882816 | |
| citations | 1 |