| contributor author | Roig, Fabien | |
| contributor author | Dusseau, L. | |
| contributor author | Ribeiro, P. | |
| contributor author | Auriel, G. | |
| contributor author | Roche, Nicholas J.-H | |
| contributor author | Privat, A. | |
| contributor author | Vaille, J.-R. | |
| contributor author | Boch, J. | |
| contributor author | Saigne, F. | |
| contributor author | Marec, R. | |
| contributor author | Calvel, P. | |
| contributor author | Bezerra, F. | |
| contributor author | Ecoffet, R. | |
| contributor author | Azais, Bruno | |
| date accessioned | 2020-03-13T00:31:10Z | |
| date available | 2020-03-13T00:31:10Z | |
| date issued | 2014 | |
| identifier issn | 0018-9499 | |
| identifier other | 6969838.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1149675?locale-attribute=fa&show=full | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8332979 | |
| subject keywords | circuit stability | |
| subject keywords | feedback amplifiers | |
| subject keywords | radiation hardening (electronics) | |
| subject keywords | resistors | |
| subject keywords | AD844 CFA | |
| subject keywords | ASET response | |
| subject keywords | ASET sensitivity | |
| subject keywords | ASET shapes | |
| subject keywords | PLSEE | |
| subject keywords | TID effects | |
| subject keywords | amplifier stability | |
| subject keywords | analog single event transients | |
| subject keywords | bipolar transistor | |
| subject keywords | circuit electrical parameters | |
| subject keywords | closed-loop gain | |
| subject keywords | external circuit designs | |
| subject keywords | feedback resistors | |
| subject keywords | feedback theory | |
| subject keywords | general electronic rules | |
| subject keywords | high speed current feedback amplifier | |
| subject keywords | pulsed laser single event effect simulation technique | |
| subject keywords | total ionizing dose | |
| subject keywords | Bipolar int | |
| identifier doi | 10.1109/TNS.2014.2369347 | |
| journal title | Nuclear Science, IEEE Transactions on | |
| journal volume | 61 | |
| journal issue | 6 | |
| filesize | 2148578 | |
| citations | 0 | |
