Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors
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سال
: 2014شناسه الکترونیک: 10.1109/TNS.2014.2369436
کلیدواژه(گان): CMOS digital integrated circuits,CMOS image sensors,photodiodes,proton effects,radiation hardening (electronics),Srour universal damage factor,dark current,digital CMOS image sensors,digital CMOS imager,main electrical parameter,pinned photodiode,proton irradiations,radiation induced dose,single event effects,Active pixel sensors,CMOS image sensors,Dark current,Ionizing radiation,Photodiodes,Radiation effects,Silicon,Single event transients,Active pixel sensor (APS),CMOS i
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Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors
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| contributor author | Virmontois, Cedric | |
| contributor author | Toulemont, Arthur | |
| contributor author | Rolland, G. | |
| contributor author | Materne, Alex | |
| contributor author | Lalucaa, Valerian | |
| contributor author | Goiffon, Vincent | |
| contributor author | Codreanu, Catalin | |
| contributor author | Durnez, Clementine | |
| contributor author | Bardoux, Alain | |
| date accessioned | 2020-03-13T00:31:10Z | |
| date available | 2020-03-13T00:31:10Z | |
| date issued | 2014 | |
| identifier issn | 0018-9499 | |
| identifier other | 6969835.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1149672?locale-attribute=fa | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8332975 | |
| subject keywords | CMOS digital integrated circuits | |
| subject keywords | CMOS image sensors | |
| subject keywords | photodiodes | |
| subject keywords | proton effects | |
| subject keywords | radiation hardening (electronics) | |
| subject keywords | Srour universal damage factor | |
| subject keywords | dark current | |
| subject keywords | digital CMOS image sensors | |
| subject keywords | digital CMOS imager | |
| subject keywords | main electrical parameter | |
| subject keywords | pinned photodiode | |
| subject keywords | proton irradiations | |
| subject keywords | radiation induced dose | |
| subject keywords | single event effects | |
| subject keywords | Active pixel sensors | |
| subject keywords | CMOS image sensors | |
| subject keywords | Dark current | |
| subject keywords | Ionizing radiation | |
| subject keywords | Photodiodes | |
| subject keywords | Radiation effects | |
| subject keywords | Silicon | |
| subject keywords | Single event transients | |
| subject keywords | Active pixel sensor (APS) | |
| subject keywords | CMOS i | |
| identifier doi | 10.1109/TNS.2014.2369436 | |
| journal title | Nuclear Science, IEEE Transactions on | |
| journal volume | 61 | |
| journal issue | 6 | |
| filesize | 1897106 | |
| citations | 0 |