•  English
    • Persian
    • English
  •   Login
  • Ferdowsi University of Mashhad
  • |
  • Information Center and Central Library
    • Persian
    • English
  • Home
  • Source Types
    • Journal Paper
    • Ebook
    • Conference Paper
    • Standard
    • Protocol
    • Thesis
  • Use Help
View Item 
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  • All Fields
  • Title
  • Author
  • Year
  • Publisher
  • Subject
  • Publication Title
  • ISSN
  • DOI
  • ISBN
Advanced Search
JavaScript is disabled for your browser. Some features of this site may not work without it.

High-performance HfO<sub>2</sub>/ZrO<sub>2</sub>/IGZO thin-film transistors deposited using atmospheric pressure plasma jet

Author:
Chien-Hung Wu
,
Kow-Ming Chang
,
Hsin-Yu Hsu
Publisher:
IET
Year
: 2014
DOI: 10.1049/el.2014.1823
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1148460
Keyword(s): hafnium compounds,high-k dielectric thin films,plasma deposition,plasma jets,semiconductor thin films,thin film transistors,zirconium compounds,APPJ IGZO film,APPJ deposition technology,APPJ indium-gallium-zinc-oxide film,HfO<,sub>,2<,/sub>,-ZrO<,sub>,2<,/sub>,IGZO-based transparent thin-film transistors,TFT,TOS film,atmospheric pressure plasma jet deposition technology,channel material,ecofriendly water-based metal salt solution,high-k dielectric HfO2-ZrO2 gate
Collections :
  • Latin Articles
  • Show Full MetaData Hide Full MetaData
  • Statistics

    High-performance HfO&lt;sub&gt;2&lt;/sub&gt;/ZrO&lt;sub&gt;2&lt;/sub&gt;/IGZO thin-film transistors deposited using atmospheric pressure plasma jet

Show full item record

contributor authorChien-Hung Wu
contributor authorKow-Ming Chang
contributor authorHsin-Yu Hsu
date accessioned2020-03-13T00:29:04Z
date available2020-03-13T00:29:04Z
date issued2014
identifier issn0013-5194
identifier other6955131.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1148460?locale-attribute=en
formatgeneral
languageEnglish
publisherIET
titleHigh-performance HfO<sub>2</sub>/ZrO<sub>2</sub>/IGZO thin-film transistors deposited using atmospheric pressure plasma jet
typeJournal Paper
contenttypeMetadata Only
identifier padid8331596
subject keywordshafnium compounds
subject keywordshigh-k dielectric thin films
subject keywordsplasma deposition
subject keywordsplasma jets
subject keywordssemiconductor thin films
subject keywordsthin film transistors
subject keywordszirconium compounds
subject keywordsAPPJ IGZO film
subject keywordsAPPJ deposition technology
subject keywordsAPPJ indium-gallium-zinc-oxide film
subject keywordsHfO<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywords-ZrO<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywordsIGZO-based transparent thin-film transistors
subject keywordsTFT
subject keywordsTOS film
subject keywordsatmospheric pressure plasma jet deposition technology
subject keywordschannel material
subject keywordsecofriendly water-based metal salt solution
subject keywordshigh-k dielectric HfO2-ZrO2 gate
identifier doi10.1049/el.2014.1823
journal titleElectronics Letters
journal volume50
journal issue23
filesize313353
citations0
  • About Us
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
DSpace software copyright © 2019-2022  DuraSpace