Characterization and Modeling of Breakdown Probability in Sub-Micrometer CMOS SPADs
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: 2014شناسه الکترونیک: 10.1109/JSTQE.2014.2327791
کلیدواژه(گان): CMOS integrated circuits,avalanche photodiodes,electric breakdown,integrated optoelectronics,breakdown probability,breakdown voltage,dead-space models,local model,p+/nwell abrupt junction,pwell/n-iso diffused junction,single-photon avalanche diodes,size 0.15 mum,submicrometer CMOS SPAD,Charge carrier processes,Electric breakdown,Electric fields,Ionization,Junctions,Semiconductor device modeling,Semiconductor process modeling,Single-photon avalanche diode (SPAD),avalanche bre
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Characterization and Modeling of Breakdown Probability in Sub-Micrometer CMOS SPADs
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| contributor author | Pancheri, Lucio | |
| contributor author | Stoppa, David | |
| contributor author | Dalla Betta, Gian-Franco | |
| date accessioned | 2020-03-13T00:11:50Z | |
| date available | 2020-03-13T00:11:50Z | |
| date issued | 2014 | |
| identifier issn | 1077-260X | |
| identifier other | 6847145.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1137858?locale-attribute=fa | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Characterization and Modeling of Breakdown Probability in Sub-Micrometer CMOS SPADs | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8319834 | |
| subject keywords | CMOS integrated circuits | |
| subject keywords | avalanche photodiodes | |
| subject keywords | electric breakdown | |
| subject keywords | integrated optoelectronics | |
| subject keywords | breakdown probability | |
| subject keywords | breakdown voltage | |
| subject keywords | dead-space models | |
| subject keywords | local model | |
| subject keywords | p+/nwell abrupt junction | |
| subject keywords | pwell/n-iso diffused junction | |
| subject keywords | single-photon avalanche diodes | |
| subject keywords | size 0.15 mum | |
| subject keywords | submicrometer CMOS SPAD | |
| subject keywords | Charge carrier processes | |
| subject keywords | Electric breakdown | |
| subject keywords | Electric fields | |
| subject keywords | Ionization | |
| subject keywords | Junctions | |
| subject keywords | Semiconductor device modeling | |
| subject keywords | Semiconductor process modeling | |
| subject keywords | Single-photon avalanche diode (SPAD) | |
| subject keywords | avalanche bre | |
| identifier doi | 10.1109/JSTQE.2014.2327791 | |
| journal title | Selected Topics in Quantum Electronics, IEEE Journal of | |
| journal volume | 20 | |
| journal issue | 6 | |
| filesize | 1303127 | |
| citations | 0 |