A New Method to Determine Avalanche Multiplication Factor Using Vector Network Analyzer for p-n Junctions
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Year
: 2014DOI: 10.1109/LMWC.2014.2330500
Keyword(s): avalanche breakdown,avalanche diodes,elemental semiconductors,equivalent circuits,network analysers,p-n junctions,silicon,tunnelling,I-MOS transistor,RF-based method,Si,avalanche diode,avalanche multiplication factor,breakdown characterization,dead-space-based theory,electric field,equivalent circuit parameter extraction,impact-ionization metal-oxide semiconductor transistor,radiofrequency-based method,saturated avalanche multiplication factor,tunnel device,tunneling multipl
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A New Method to Determine Avalanche Multiplication Factor Using Vector Network Analyzer for p-n Junctions
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| contributor author | Chie-In Lee | |
| contributor author | Wei-Cheng Lin | |
| contributor author | Yan-Ting Lin | |
| date accessioned | 2020-03-13T00:10:57Z | |
| date available | 2020-03-13T00:10:57Z | |
| date issued | 2014 | |
| identifier issn | 1531-1309 | |
| identifier other | 6843367.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1137357?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | A New Method to Determine Avalanche Multiplication Factor Using Vector Network Analyzer for p-n Junctions | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8319234 | |
| subject keywords | avalanche breakdown | |
| subject keywords | avalanche diodes | |
| subject keywords | elemental semiconductors | |
| subject keywords | equivalent circuits | |
| subject keywords | network analysers | |
| subject keywords | p-n junctions | |
| subject keywords | silicon | |
| subject keywords | tunnelling | |
| subject keywords | I-MOS transistor | |
| subject keywords | RF-based method | |
| subject keywords | Si | |
| subject keywords | avalanche diode | |
| subject keywords | avalanche multiplication factor | |
| subject keywords | breakdown characterization | |
| subject keywords | dead-space-based theory | |
| subject keywords | electric field | |
| subject keywords | equivalent circuit parameter extraction | |
| subject keywords | impact-ionization metal-oxide semiconductor transistor | |
| subject keywords | radiofrequency-based method | |
| subject keywords | saturated avalanche multiplication factor | |
| subject keywords | tunnel device | |
| subject keywords | tunneling multipl | |
| identifier doi | 10.1109/LMWC.2014.2330500 | |
| journal title | Microwave and Wireless Components Letters, IEEE | |
| journal volume | 24 | |
| journal issue | 9 | |
| filesize | 385639 | |
| citations | 0 |