A Fully Integrated BIST <inline-formula> <img src="/images/tex/21737.gif" alt="\\Delta \\Sigma "> </inline-formula> ADC Using the In-Phase and Quadrature Waves Fitting Procedure
Publisher:
Year
: 2014DOI: 10.1109/TIM.2014.2322714
Keyword(s): analogue-digital conversion,built-in self test,design for testability,fast Fourier transforms,phase measurement,FFT analysis,analog to digital converter,built in self test,fast Fourier transform,fully integrated BIST ADC,in phase and quadrature waves fitting procedure,on chip stimulus generator,response analyzer,Analog-digital conversion,Built-in self-test,Delta-sigma modulation,Design for testability,&,#x0394,&,#x03A3,modulation,(Delta Sigma ) modulation,ADC test,anal
Collections
:
-
Statistics
A Fully Integrated BIST <inline-formula> <img src="/images/tex/21737.gif" alt="\\Delta \\Sigma "> </inline-formula> ADC Using the In-Phase and Quadrature Waves Fitting Procedure
Show full item record
| contributor author | Shao-Feng Hung | |
| contributor author | Hao-Chiao Hong | |
| date accessioned | 2020-03-13T00:05:07Z | |
| date available | 2020-03-13T00:05:07Z | |
| date issued | 2014 | |
| identifier issn | 0018-9456 | |
| identifier other | 6820774.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1133833?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | A Fully Integrated BIST <inline-formula> <img src="/images/tex/21737.gif" alt="\\Delta \\Sigma "> </inline-formula> ADC Using the In-Phase and Quadrature Waves Fitting Procedure | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8315053 | |
| subject keywords | analogue-digital conversion | |
| subject keywords | built-in self test | |
| subject keywords | design for testability | |
| subject keywords | fast Fourier transforms | |
| subject keywords | phase measurement | |
| subject keywords | FFT analysis | |
| subject keywords | analog to digital converter | |
| subject keywords | built in self test | |
| subject keywords | fast Fourier transform | |
| subject keywords | fully integrated BIST ADC | |
| subject keywords | in phase and quadrature waves fitting procedure | |
| subject keywords | on chip stimulus generator | |
| subject keywords | response analyzer | |
| subject keywords | Analog-digital conversion | |
| subject keywords | Built-in self-test | |
| subject keywords | Delta-sigma modulation | |
| subject keywords | Design for testability | |
| subject keywords | & | |
| subject keywords | #x0394 | |
| subject keywords | & | |
| subject keywords | #x03A3 | |
| subject keywords | modulation | |
| subject keywords | (Delta Sigma ) modulation | |
| subject keywords | ADC test | |
| subject keywords | anal | |
| identifier doi | 10.1109/TIM.2014.2322714 | |
| journal title | Instrumentation and Measurement, IEEE Transactions on | |
| journal volume | 63 | |
| journal issue | 12 | |
| filesize | 2816174 | |
| citations | 0 |