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Insulation Resistance and Leakage Currents in Low-Voltage Ceramic Capacitors With Cracks

contributor authorTeverovsky, Alexander
date accessioned2020-03-13T00:03:59Z
date available2020-03-13T00:03:59Z
date issued2014
identifier issn2156-3950
identifier other6817589.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1133147?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleInsulation Resistance and Leakage Currents in Low-Voltage Ceramic Capacitors With Cracks
typeJournal Paper
contenttypeMetadata Only
identifier padid8314268
subject keywordsceramic capacitors
subject keywordscracks
subject keywordsleakage currents
subject keywordsabsorption currents
subject keywordsactivation energy
subject keywordscracks
subject keywordselectron volt energy 0.6 eV to 1.1 eV
subject keywordsinsulation resistance measurement
subject keywordsintrinsic leakage currents
subject keywordsmechanical defects
subject keywordsmultilayer ceramic capacitors
subject keywordsroom temperature
subject keywordsAbsorption
subject keywordsCapacitance
subject keywordsCapacitors
subject keywordsCurrent measurement
subject keywordsLeakage currents
subject keywordsTemperature measurement
subject keywordsVoltage measurement
subject keywordsCeramic capacitors
subject keywordscrack detection
subject keywordsdielectric polarization
subject keywordsinsulation testing
subject keywordsleakage current
subject keywordstesting
subject keywordstesti
identifier doi10.1109/TCPMT.2014.2318178
journal titleComponents, Packaging and Manufacturing Technology, IEEE Transactions on
journal volume4
journal issue7
filesize2170997
citations0


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