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Role of Injection Barrier in Capacitance-Voltage Measurements of Organic Devices

contributor authorNigam, Abhishek
contributor authorNair, P.R.
contributor authorPremaratne, Malin
contributor authorRao, Valipe Ramgopal
date accessioned2020-03-12T23:56:46Z
date available2020-03-12T23:56:46Z
date issued2014
identifier issn0741-3106
identifier other6784309.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1128970?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleRole of Injection Barrier in Capacitance-Voltage Measurements of Organic Devices
typeJournal Paper
contenttypeMetadata Only
identifier padid8309247
subject keywordscapacitance measurement
subject keywordsorganic semiconductors
subject keywordssemiconductor doping
subject keywordsvoltage measurement
subject keywordsC-V measurements
subject keywordsOSC
subject keywordsambient exposure
subject keywordsambient-induced unintentional doping
subject keywordscapacitance-voltage measurements
subject keywordscarrier injection barrier
subject keywordselectrode interface
subject keywordsnumerical simulations
subject keywordsorganic devices
subject keywordsorganic semiconductors
subject keywordsresponse time
subject keywordsCapacitance
subject keywordsCutoff frequency
subject keywordsDoping
subject keywordsPentacene
subject keywordsPhysics
subject keywordsSemiconductor device measurement
subject keywordsVoltage measurement
subject keywordsCapacitance
subject keywordsInjection Barrier
subject keywordsOrganic field effect t
identifier doi10.1109/LED.2014.2313411
journal titleElectron Device Letters, IEEE
journal volume35
journal issue5
filesize500872
citations0


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