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THz Measurements and Calibration Based on a Blackbody Source

contributor authorSvetlitza, Alexander
contributor authorSlavenko, Michael
contributor authorBlank, Tanya
contributor authorBrouk, Igor
contributor authorStolyarova, Sara
contributor authorNemirovsky, Yael
date accessioned2020-03-12T23:52:55Z
date available2020-03-12T23:52:55Z
date issued2014
identifier issn2156-342X
identifier other6774490.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1126686?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleTHz Measurements and Calibration Based on a Blackbody Source
typeJournal Paper
contenttypeMetadata Only
identifier padid8306568
subject keywordsCMOS image sensors
subject keywordsblackbody radiation
subject keywordscalibration
subject keywordsinfrared imaging
subject keywordsnanosensors
subject keywordssilicon-on-insulator
subject keywordsterahertz wave detectors
subject keywordsCMOS transistors
subject keywordsCMOS-SOI-NEMS thermal sensor
subject keywordsSi
subject keywordsTHz measurements
subject keywordsTHz sensors
subject keywordsTeraMOS sensor
subject keywordsblackbody source
subject keywordscalibration
subject keywordscommercial off-the-shelf component
subject keywordsmesh filters
subject keywordsmonolithic uncooled passive THz imagers
subject keywordstemperature 1300 K
subject keywordsuncooled passive thermal imaging:
subject keywordsChoppers (circuits)
subject keywordsImaging
subject keywordsTemperature measurement
subject keywordsTemperature sensors
subject keywordsWavelength meas
identifier doi10.1109/TTHZ.2014.2309003
journal titleTerahertz Science and Technology, IEEE Transactions on
journal volume4
journal issue3
filesize3132467
citations0


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