E<sup>2</sup>MD for reduction of motion artifacts from photoplethysmographic signals
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: 2014شناسه الکترونیک: 10.1109/DFT.2014.6962090
کلیدواژه(گان): fault diagnosis,logic testing,microprocessor chips,reduced instruction set computing,system-on-chip,PowerPC derived processor,SBST approach,decode units,functional test programs,in-field functional testing,industrial SoC device,instruction classification,instruction manipulation,pipelined RISC processors,signatures collection,stuck-at fault coverage,Encoding,Law,Reduced instruction set computing,Registers,Testing,Software-Based Self-Test programs,decode unit,fault grading
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E<sup>2</sup>MD for reduction of motion artifacts from photoplethysmographic signals
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contributor author | Raghuram, M. , Sivani, K. , Reddy, K.A. | |
date accessioned | 2020-03-12T23:27:25Z | |
date available | 2020-03-12T23:27:25Z | |
date issued | 2014 | |
identifier other | 6892793.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1112313 | |
format | general | |
language | English | |
publisher | IEEE | |
title | E<sup>2</sup>MD for reduction of motion artifacts from photoplethysmographic signals | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8281225 | |
subject keywords | fault diagnosis | |
subject keywords | logic testing | |
subject keywords | microprocessor chips | |
subject keywords | reduced instruction set computing | |
subject keywords | system-on-chip | |
subject keywords | PowerPC derived processor | |
subject keywords | SBST approach | |
subject keywords | decode units | |
subject keywords | functional test programs | |
subject keywords | in-field functional testing | |
subject keywords | industrial SoC device | |
subject keywords | instruction classification | |
subject keywords | instruction manipulation | |
subject keywords | pipelined RISC processors | |
subject keywords | signatures collection | |
subject keywords | stuck-at fault coverage | |
subject keywords | Encoding | |
subject keywords | Law | |
subject keywords | Reduced instruction set computing | |
subject keywords | Registers | |
subject keywords | Testing | |
subject keywords | Software-Based Self-Test programs | |
subject keywords | decode unit | |
subject keywords | fault grading | |
identifier doi | 10.1109/DFT.2014.6962090 | |
journal title | lectronics and Communication Systems (ICECS), 2014 International Conference on | |
filesize | 1633167 | |
citations | 0 |