Transverse dynamics of the relativistic electron beams passing through coaxial cylindrical dielectric waveguides
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: 2014شناسه الکترونیک: 10.1109/ULTSYM.2014.0069
کلیدواژه(گان): elastic constants,plasma CVD,silicon compounds,surface acoustic wave delay lines,thin films,SAW phase velocity,SiO<,sub>,2<,/sub>,differential delay lines,elastic constants,film thickness,physical vapour deposition,plasma enhanced chemical vapour deposition,thin films,Accuracy,Delay lines,Lithium niobate,Materials,Surface acoustic waves,Thickness measurement
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Transverse dynamics of the relativistic electron beams passing through coaxial cylindrical dielectric waveguides
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contributor author | Altmark, A.M. , Kanareykin, A.D. | |
date accessioned | 2020-03-12T23:24:39Z | |
date available | 2020-03-12T23:24:39Z | |
date issued | 2014 | |
identifier other | 6889990.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1110522 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Transverse dynamics of the relativistic electron beams passing through coaxial cylindrical dielectric waveguides | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8279239 | |
subject keywords | elastic constants | |
subject keywords | plasma CVD | |
subject keywords | silicon compounds | |
subject keywords | surface acoustic wave delay lines | |
subject keywords | thin films | |
subject keywords | SAW phase velocity | |
subject keywords | SiO< | |
subject keywords | sub> | |
subject keywords | 2< | |
subject keywords | /sub> | |
subject keywords | differential delay lines | |
subject keywords | elastic constants | |
subject keywords | film thickness | |
subject keywords | physical vapour deposition | |
subject keywords | plasma enhanced chemical vapour deposition | |
subject keywords | thin films | |
subject keywords | Accuracy | |
subject keywords | Delay lines | |
subject keywords | Lithium niobate | |
subject keywords | Materials | |
subject keywords | Surface acoustic waves | |
subject keywords | Thickness measurement | |
identifier doi | 10.1109/ULTSYM.2014.0069 | |
journal title | eam Dynamics and Optimization (BDO), 2014 20th International Workshop on | |
filesize | 214377 | |
citations | 0 |