Measuring and Evaluating Live Content Consistency in a Large-Scale CDN
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Year
: 2014DOI: 10.1109/WSC.2014.7020111
Keyword(s): Gaussian processes,covariance analysis,power semiconductor devices,regression analysis,Gaussian process,covariance functions,ordinary linear based regression models,smart power semiconductor lifetime data,Bayes methods,Data models,Failure analysis,Predictive models,Reliability,Semiconductor device measurement,Stress
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Measuring and Evaluating Live Content Consistency in a Large-Scale CDN
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| contributor author | Guoxin Liu , Haiying Shen , Chandler, H. , Jin Li | |
| date accessioned | 2020-03-12T23:23:19Z | |
| date available | 2020-03-12T23:23:19Z | |
| date issued | 2014 | |
| identifier other | 6888903.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1109688?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Measuring and Evaluating Live Content Consistency in a Large-Scale CDN | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8278326 | |
| subject keywords | Gaussian processes | |
| subject keywords | covariance analysis | |
| subject keywords | power semiconductor devices | |
| subject keywords | regression analysis | |
| subject keywords | Gaussian process | |
| subject keywords | covariance functions | |
| subject keywords | ordinary linear based regression models | |
| subject keywords | smart power semiconductor lifetime data | |
| subject keywords | Bayes methods | |
| subject keywords | Data models | |
| subject keywords | Failure analysis | |
| subject keywords | Predictive models | |
| subject keywords | Reliability | |
| subject keywords | Semiconductor device measurement | |
| subject keywords | Stress | |
| identifier doi | 10.1109/WSC.2014.7020111 | |
| journal title | istributed Computing Systems (ICDCS), 2014 IEEE 34th International Conference on | |
| filesize | 925723 | |
| citations | 0 |