Model based generation of high coverage test suites for embedded systems
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Year
: 2014DOI: 10.1109/VTCSpring.2014.7022894
Keyword(s): Artificial neural networks,Fading,Gain,Interference,Shadow mapping,Signal to noise ratio,Wireless communication
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Model based generation of high coverage test suites for embedded systems
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| contributor author | Ferrante, O. , Ferrari, A. , Marazza, M. | |
| date accessioned | 2020-03-12T23:21:07Z | |
| date available | 2020-03-12T23:21:07Z | |
| date issued | 2014 | |
| identifier other | 6847843.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1108384 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Model based generation of high coverage test suites for embedded systems | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8276663 | |
| subject keywords | Artificial neural networks | |
| subject keywords | Fading | |
| subject keywords | Gain | |
| subject keywords | Interference | |
| subject keywords | Shadow mapping | |
| subject keywords | Signal to noise ratio | |
| subject keywords | Wireless communication | |
| identifier doi | 10.1109/VTCSpring.2014.7022894 | |
| journal title | est Symposium (ETS), 2014 19th IEEE European | |
| filesize | 157817 | |
| citations | 0 |