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contributor authorMalucci, Robert D.
date accessioned2020-03-12T22:56:43Z
date available2020-03-12T22:56:43Z
date issued2014
identifier other7031073.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1099987?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleAccelerated testing for electro-migration
typeConference Paper
contenttypeMetadata Only
identifier padid8241848
subject keywordsAccuracy
subject keywordsn Detectors
subject keywordsn Feature extraction
subject keywordsn Image color analysis
subject keywordsn Robustness
subject keywordsn Skin
subject keywordsn Tracking
subject keywordsn hand detection
subject keywordsn hand tracking
subject keywordsn human computer interaction(HCI)
identifier doi10.1109/IHMSC.2014.135
journal titlelectrical Contacts (Holm), 2014 IEEE 60th Holm Conference on
filesize703718
citations0


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