Preface to IClaNov 2014
Publisher:
Year
: 2014DOI: 10.1109/ISVLSI.2014.80
Keyword(s): calibration,n cryptography,n integrated circuit manufacture,n integrated circuit noise,n integrated circuit reliability,n integrated circuit testing,n random number generation,n IC fabrication process,n cryptographic primitives harness randomness,n hardware security primitives,n on-chip calibration,n on-chip noise,n physical unclonable functions,n post-silicon validation,n reliability,n true random number generators,n Circuit faults,n Delays
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Preface to IClaNov 2014
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date accessioned | 2020-03-12T22:45:25Z | |
date available | 2020-03-12T22:45:25Z | |
date issued | 2014 | |
identifier other | 7022561.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1093475?locale-attribute=en | |
format | general | |
language | English | |
publisher | IEEE | |
title | Preface to IClaNov 2014 | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8232905 | |
subject keywords | calibration | |
subject keywords | n cryptography | |
subject keywords | n integrated circuit manufacture | |
subject keywords | n integrated circuit noise | |
subject keywords | n integrated circuit reliability | |
subject keywords | n integrated circuit testing | |
subject keywords | n random number generation | |
subject keywords | n IC fabrication process | |
subject keywords | n cryptographic primitives harness randomness | |
subject keywords | n hardware security primitives | |
subject keywords | n on-chip calibration | |
subject keywords | n on-chip noise | |
subject keywords | n physical unclonable functions | |
subject keywords | n post-silicon validation | |
subject keywords | n reliability | |
subject keywords | n true random number generators | |
subject keywords | n Circuit faults | |
subject keywords | n Delays | |
identifier doi | 10.1109/ISVLSI.2014.80 | |
journal title | ata Mining Workshop (ICDMW), 2014 IEEE International Conference on | |
filesize | 130056 | |
citations | 0 |