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Instabilities induced by electron trapping/detrapping in high-k gate dielectrics of Flash memories: Evaluation and suppression

contributor authorRobinson, C.
contributor authorZhang, W.D.
contributor authorBaojun Tang
contributor authorZheng, X.F.
contributor authorZhang, J.F.
date accessioned2020-03-12T22:44:15Z
date available2020-03-12T22:44:15Z
date issued2014
identifier other7021483.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1092827?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleInstabilities induced by electron trapping/detrapping in high-k gate dielectrics of Flash memories: Evaluation and suppression
typeConference Paper
contenttypeMetadata Only
identifier padid8232069
subject keywordsUHF antennas
subject keywordsn antenna radiation patterns
subject keywordsn biological tissues
subject keywordsn biomedical communication
subject keywordsn dielectric materials
subject keywordsn directive antennas
subject keywordsn helical antennas
subject keywordsn impedance matching
subject keywordsn spiral antennas
subject keywordsn ultra wideband antennas
subject keywordsn circular polar pattern
subject keywordsn compact ultra-wideband spiral helix antenna
subject keywordsn dielectric material
subject keywordsn directive antenna radiation pattern
subject keywordsn distillated water
subject keywordsn electromagnetic computation
subject keywordsn embedded antenna
subject keywordsn frequency 3 GHz to 10 GHz
identifier doi10.1109/EuCAP.2014.6902482
journal titleolid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
filesize1556381
citations0


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