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An efficient test structure for interface trap characterization under BTI stresses

contributor authorYandong He
contributor authorGanggang Zhang
contributor authorLin Han
contributor authorXing Zhang
date accessioned2020-03-12T22:43:47Z
date available2020-03-12T22:43:47Z
date issued2014
identifier other7021291.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1092603?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleAn efficient test structure for interface trap characterization under BTI stresses
typeConference Paper
contenttypeMetadata Only
identifier padid8231779
subject keywordsantenna arrays
subject keywordsn astronomical telescopes
subject keywordsn polarimeters
subject keywordsn radioastronomy
subject keywordsn SKA telescope
subject keywordsn antenna arrays
subject keywordsn commercial EM software packages
subject keywordsn intrinsic cross-polarization ratio
subject keywordsn low frequency radio astronomy
subject keywordsn near field measurements
subject keywordsn radio polarimeters
subject keywordsn Antenna arrays
subject keywordsn Antenna measurements
subject keywordsn Computational modeling
subject keywordsn Extraterrestrial measurements
subject keywordsn Radio astronomy
subject keywordsn antenna
subject keywordsn array
subject keywordsn measurement
subject keywordsn polarisation
identifier doi10.1109/EuCAP.2014.6902290
journal titleolid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
filesize1009426
citations0


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