Optimization of energy production of a CHP plant with heat storage
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سال
: 2014شناسه الکترونیک: 10.1109/ARFTG.2014.6899529
کلیدواژه(گان): S-parameters,n bending,n cables (electric),n calibration,n measurement errors,n measurement uncertainty,n network analysers,n VNA,n deembedding cable flexure error method,n high-precision S-parameter measurement,n two-port electronic calibration unit,n Calibration,n Impedance,n Impedance measurement,n Measurement uncertainty,n Scattering parameters,n Semiconductor device measurement,n Standards,n PNA,n RF,n S-parameters,n VNA,n ca
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آمار بازدید
Optimization of energy production of a CHP plant with heat storage
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| contributor author | Abdollahi, E. | |
| contributor author | Haichao Wang | |
| contributor author | Rinne, S. | |
| contributor author | Lahdelma, R. | |
| date accessioned | 2020-03-12T22:39:42Z | |
| date available | 2020-03-12T22:39:42Z | |
| date issued | 2014 | |
| identifier other | 7018636.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1090335 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Optimization of energy production of a CHP plant with heat storage | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8228741 | |
| subject keywords | S-parameters | |
| subject keywords | n bending | |
| subject keywords | n cables (electric) | |
| subject keywords | n calibration | |
| subject keywords | n measurement errors | |
| subject keywords | n measurement uncertainty | |
| subject keywords | n network analysers | |
| subject keywords | n VNA | |
| subject keywords | n deembedding cable flexure error method | |
| subject keywords | n high-precision S-parameter measurement | |
| subject keywords | n two-port electronic calibration unit | |
| subject keywords | n Calibration | |
| subject keywords | n Impedance | |
| subject keywords | n Impedance measurement | |
| subject keywords | n Measurement uncertainty | |
| subject keywords | n Scattering parameters | |
| subject keywords | n Semiconductor device measurement | |
| subject keywords | n Standards | |
| subject keywords | n PNA | |
| subject keywords | n RF | |
| subject keywords | n S-parameters | |
| subject keywords | n VNA | |
| subject keywords | n ca | |
| identifier doi | 10.1109/ARFTG.2014.6899529 | |
| journal title | reen Energy and Systems Conference (IGESC), 2014 IEEE | |
| filesize | 779163 | |
| citations | 1 |