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Nanoscale thick FDSOI MOSFETs: A simple model of abnormal electrical behavior at low temperature

contributor authorKarsenty, Avi
contributor authorChelly, Avraham
date accessioned2020-03-12T22:22:43Z
date available2020-03-12T22:22:43Z
date issued2014
identifier other7005898.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1080967?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleNanoscale thick FDSOI MOSFETs: A simple model of abnormal electrical behavior at low temperature
typeConference Paper
contenttypeMetadata Only
identifier padid8217407
subject keywordsGaussian processes
subject keywordsn object detection
subject keywordsn camera viewpoint
subject keywordsn modified mixture
subject keywordsn multiple Gaussian models
subject keywordsn object detection
subject keywordsn robust background generation method
subject keywordsn Cameras
subject keywordsn Gaussian distribution
subject keywordsn Mathematical model
subject keywordsn Object detection
subject keywordsn Probability density function
subject keywordsn Robustness
subject keywordsn Surveillance
subject keywordsn background modeling
subject keywordsn object detection
identifier doi10.1109/ISCE.2014.6884522
journal titlelectrical & Electronics Engineers in Israel (IEEEI), 2014 IEEE 28th Convention of
filesize569605
citations0


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