Manage the Automotive Embedded Software Development Cost & Productivity with the Automation of a Functional Size Measurement Method (COSMIC)
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Year
: 2014DOI: 10.1109/COMPEL.2014.6877158
Keyword(s): predictive control,n switching convertors,n hybrid 3L-NPC converter,n loss distribution,n model predictive control,n neutral point diodes,n output waveform quality,n overall converter power losses,n reduced switching losses,n Power electronics,n Predictive control,n Semiconductor diodes,n Silicon carbide,n Switches,n Switching loss
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Manage the Automotive Embedded Software Development Cost & Productivity with the Automation of a Functional Size Measurement Method (COSMIC)
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| contributor author | Oriou, Alexandre | |
| contributor author | Bronca, Eric | |
| contributor author | Bouzid, Boubker | |
| contributor author | Guetta, Olivier | |
| contributor author | Guillard, Kevin | |
| date accessioned | 2020-03-12T22:15:55Z | |
| date available | 2020-03-12T22:15:55Z | |
| date issued | 2014 | |
| identifier other | 7000066.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1076952 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Manage the Automotive Embedded Software Development Cost & Productivity with the Automation of a Functional Size Measurement Method (COSMIC) | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8213187 | |
| subject keywords | predictive control | |
| subject keywords | n switching convertors | |
| subject keywords | n hybrid 3L-NPC converter | |
| subject keywords | n loss distribution | |
| subject keywords | n model predictive control | |
| subject keywords | n neutral point diodes | |
| subject keywords | n output waveform quality | |
| subject keywords | n overall converter power losses | |
| subject keywords | n reduced switching losses | |
| subject keywords | n Power electronics | |
| subject keywords | n Predictive control | |
| subject keywords | n Semiconductor diodes | |
| subject keywords | n Silicon carbide | |
| subject keywords | n Switches | |
| subject keywords | n Switching loss | |
| identifier doi | 10.1109/COMPEL.2014.6877158 | |
| journal title | oftware Measurement and the International Conference on Software Process and Product Measurement (IW | |
| filesize | 419290 | |
| citations | 0 |