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From the editors

Publisher:
IEEE
Year
: 2014
DOI: 10.1109/IOLTS.2014.6873692
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1074232
Keyword(s): benchmark testing,n digital integrated circuits,n fault diagnosis,n formal specification,n integrated circuit testing,n radiation hardening (electronics),n ITC99 benchmark,n SEU sensitivity,n digital circuits,n fault injection experiments,n formal specification language,n linear temporal logic,n model-checking tool,n single event upsets,n static analysis,n untestable fault identification,n Circuit faults,n Field programmable gate arrays,n Int
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date accessioned2020-03-12T22:10:55Z
date available2020-03-12T22:10:55Z
date issued2014
identifier other6996807.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1074232?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleFrom the editors
typeConference Paper
contenttypeMetadata Only
identifier padid8210367
subject keywordsbenchmark testing
subject keywordsn digital integrated circuits
subject keywordsn fault diagnosis
subject keywordsn formal specification
subject keywordsn integrated circuit testing
subject keywordsn radiation hardening (electronics)
subject keywordsn ITC99 benchmark
subject keywordsn SEU sensitivity
subject keywordsn digital circuits
subject keywordsn fault injection experiments
subject keywordsn formal specification language
subject keywordsn linear temporal logic
subject keywordsn model-checking tool
subject keywordsn single event upsets
subject keywordsn static analysis
subject keywordsn untestable fault identification
subject keywordsn Circuit faults
subject keywordsn Field programmable gate arrays
subject keywordsn Int
identifier doi10.1109/IOLTS.2014.6873692
journal titleiezoelectricity, Acoustic Waves, and Device Applications (SPAWDA), 2014 Symposium on
filesize107500
citations0
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