From the editors

ناشر:
سال
: 2014
شناسه الکترونیک: 10.1109/IOLTS.2014.6873692
کلیدواژه(گان): benchmark testing,n digital integrated circuits,n fault diagnosis,n formal specification,n integrated circuit testing,n radiation hardening (electronics),n ITC99 benchmark,n SEU sensitivity,n digital circuits,n fault injection experiments,n formal specification language,n linear temporal logic,n model-checking tool,n single event upsets,n static analysis,n untestable fault identification,n Circuit faults,n Field programmable gate arrays,n Int
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