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Active dipole coupling in an array environment

Author:
Visser, Hubregt J.
,
Lulu Chan
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/PRIME.2014.6872674
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1073857
Keyword(s): fault diagnosis,n integrated circuit reliability,n microprocessor chips,n radiation hardening (electronics),n SPARC microprocessor,n application program,n classical fault-injection approach,n embedded microprocessor-based systems,n error correcting codes,n external memories,n fast register criticality evaluation,n internal register criticality,n microarchitectural features,n robustness analysis,n safety constraints,n security constraints,n selectiv
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    Active dipole coupling in an array environment

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contributor authorVisser, Hubregt J.
contributor authorLulu Chan
date accessioned2020-03-12T22:10:10Z
date available2020-03-12T22:10:10Z
date issued2014
identifier other6996377.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1073857?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleActive dipole coupling in an array environment
typeConference Paper
contenttypeMetadata Only
identifier padid8209984
subject keywordsfault diagnosis
subject keywordsn integrated circuit reliability
subject keywordsn microprocessor chips
subject keywordsn radiation hardening (electronics)
subject keywordsn SPARC microprocessor
subject keywordsn application program
subject keywordsn classical fault-injection approach
subject keywordsn embedded microprocessor-based systems
subject keywordsn error correcting codes
subject keywordsn external memories
subject keywordsn fast register criticality evaluation
subject keywordsn internal register criticality
subject keywordsn microarchitectural features
subject keywordsn robustness analysis
subject keywordsn safety constraints
subject keywordsn security constraints
subject keywordsn selectiv
identifier doi10.1109/PRIME.2014.6872674
journal titlentennas and Propagation Conference (LAPC), 2014 Loughborough
filesize1063204
citations0
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