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Transient power quality assessment based on big data analysis

contributor authorHuang Zhiwei
contributor authorGao Tian
contributor authorZhang Huaving
contributor authorHan Xu
contributor authorCao Junwei
contributor authorHu Ziheng
contributor authorYao Senjing
contributor authorZhu Zhengguo
date accessioned2020-03-12T22:04:46Z
date available2020-03-12T22:04:46Z
date issued2014
identifier other6991919.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1070551?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleTransient power quality assessment based on big data analysis
typeConference Paper
contenttypeMetadata Only
identifier padid8206614
subject keywordsannealing
subject keywordsn electric sensing devices
subject keywordsn gallium compounds
subject keywordsn indium compounds
subject keywordsn optical sensors
subject keywordsn thin film sensors
subject keywordsn thin film transistors
subject keywordsn I<
subject keywordssub>
subject keywordsds<
subject keywords/sub>
subject keywords-V<
subject keywordssub>
subject keywordsgs<
subject keywords/sub>
subject keywordscharacteristics
subject keywordsn InGaZnO
subject keywordsn TFT
subject keywordsn amorphous thin-film transistor
subject keywordsn applied voltage history sensor
subject keywordsn gate voltage application
subject keywordsn high oxygen pressure
subject keywordsn light illumination
subject keywordsn light irradiation history sensor
subject keywordsn ozone annealing
subject keywordsn threshold voltage
subject keywordsn Annealin
identifier doi10.1109/AM-FPD.2014.6867208
journal titlelectricity Distribution (CICED), 2014 China International Conference on
filesize1094754
citations0


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