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An accident analysis of a smart substation

contributor authorNiu, XueYuan
contributor authorZhai, JianFan
contributor authorLi, ChunLin
contributor authorLi, Chao
contributor authorNiu, JuYuan
date accessioned2020-03-12T22:04:39Z
date available2020-03-12T22:04:39Z
date issued2014
identifier other6991853.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1070485?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleAn accident analysis of a smart substation
typeConference Paper
contenttypeMetadata Only
identifier padid8206547
subject keywordsamorphous semiconductors
subject keywordsn gallium compounds
subject keywordsn indium compounds
subject keywordsn semiconductor thin films
subject keywordsn surface roughness
subject keywordsn thin film transistors
subject keywordsn zinc compounds
subject keywordsn InGaZnO
subject keywordsn active layer thickness effect
subject keywordsn bottom-gate top-contact architectures
subject keywordsn electrical characteristics
subject keywordsn electrical properties
subject keywordsn multistacked active layer
subject keywordsn on-off ration
subject keywordsn solution-processed a-IGZO TFTs
subject keywordsn stacking layers
subject keywordsn subthreshold swing
subject keywordsn surface roughness
subject keywordsn threshold voltage
identifier doi10.1109/AM-FPD.2014.6867142
journal titlelectricity Distribution (CICED), 2014 China International Conference on
filesize519286
citations1


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