An accident analysis of a smart substation
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سال
: 2014شناسه الکترونیک: 10.1109/AM-FPD.2014.6867142
کلیدواژه(گان): amorphous semiconductors,n gallium compounds,n indium compounds,n semiconductor thin films,n surface roughness,n thin film transistors,n zinc compounds,n InGaZnO,n active layer thickness effect,n bottom-gate top-contact architectures,n electrical characteristics,n electrical properties,n multistacked active layer,n on-off ration,n solution-processed a-IGZO TFTs,n stacking layers,n subthreshold swing,n surface roughness,n threshold voltage
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آمار بازدید
An accident analysis of a smart substation
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contributor author | Niu, XueYuan | |
contributor author | Zhai, JianFan | |
contributor author | Li, ChunLin | |
contributor author | Li, Chao | |
contributor author | Niu, JuYuan | |
date accessioned | 2020-03-12T22:04:39Z | |
date available | 2020-03-12T22:04:39Z | |
date issued | 2014 | |
identifier other | 6991853.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1070485 | |
format | general | |
language | English | |
publisher | IEEE | |
title | An accident analysis of a smart substation | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8206547 | |
subject keywords | amorphous semiconductors | |
subject keywords | n gallium compounds | |
subject keywords | n indium compounds | |
subject keywords | n semiconductor thin films | |
subject keywords | n surface roughness | |
subject keywords | n thin film transistors | |
subject keywords | n zinc compounds | |
subject keywords | n InGaZnO | |
subject keywords | n active layer thickness effect | |
subject keywords | n bottom-gate top-contact architectures | |
subject keywords | n electrical characteristics | |
subject keywords | n electrical properties | |
subject keywords | n multistacked active layer | |
subject keywords | n on-off ration | |
subject keywords | n solution-processed a-IGZO TFTs | |
subject keywords | n stacking layers | |
subject keywords | n subthreshold swing | |
subject keywords | n surface roughness | |
subject keywords | n threshold voltage | |
identifier doi | 10.1109/AM-FPD.2014.6867142 | |
journal title | lectricity Distribution (CICED), 2014 China International Conference on | |
filesize | 519286 | |
citations | 1 |