Electrostatic discharge testing of several ESD protective textiles used in electronic industry
Publisher:
Year
: 2014DOI: 10.1109/ICMTS.2014.6841465
Keyword(s): flash memories,n integrated circuit reliability,n common floating gate test structure,n cycling induced degradation component,n degradation mechanisms,n floating gate oxide,n split gate flash memory cells,n split-gate SuperFlash memory,n tunnel oxide,n Charge carrier processes,n Degradation,n Logic gates,n Nonvolatile memory,n Programming,n Split gate flash memory cells,n Tunneling,n Flash memory,n electron trapping,n electron tunneling
Collections
:
-
Statistics
Electrostatic discharge testing of several ESD protective textiles used in electronic industry
Show full item record
| contributor author | Telipan, Gabriela | |
| contributor author | Ignat, Mircea | |
| contributor author | Catanescu, Laurentiu | |
| contributor author | Moasa, Beatrice | |
| date accessioned | 2020-03-12T21:59:43Z | |
| date available | 2020-03-12T21:59:43Z | |
| date issued | 2014 | |
| identifier other | 6969980.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1067759 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Electrostatic discharge testing of several ESD protective textiles used in electronic industry | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8202587 | |
| subject keywords | flash memories | |
| subject keywords | n integrated circuit reliability | |
| subject keywords | n common floating gate test structure | |
| subject keywords | n cycling induced degradation component | |
| subject keywords | n degradation mechanisms | |
| subject keywords | n floating gate oxide | |
| subject keywords | n split gate flash memory cells | |
| subject keywords | n split-gate SuperFlash memory | |
| subject keywords | n tunnel oxide | |
| subject keywords | n Charge carrier processes | |
| subject keywords | n Degradation | |
| subject keywords | n Logic gates | |
| subject keywords | n Nonvolatile memory | |
| subject keywords | n Programming | |
| subject keywords | n Split gate flash memory cells | |
| subject keywords | n Tunneling | |
| subject keywords | n Flash memory | |
| subject keywords | n electron trapping | |
| subject keywords | n electron tunneling | |
| identifier doi | 10.1109/ICMTS.2014.6841465 | |
| journal title | lectrical and Power Engineering (EPE), 2014 International Conference and Exposition on | |
| filesize | 781524 | |
| citations | 0 |