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Investigation of the textile structures with different design used in electromagnetic shielding

Author:
Apreutesei, Alina - Lacramioara
,
Curteza, Antonela
,
David, Valeriu
,
Nica, Ionut
,
Rau, Miuta
,
Baltag, Octavian
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICMTS.2014.6841464
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1067758
Keyword(s): antimony compounds,n charge injection,n germanium compounds,n phase change memories,n semiconductor superlattices,n transient analysis,n 1R test structure analysis,n AC transient analysis,n DC sweep analysis,n GeTe-Sb<,sub>,2<,/sub>,Te<,sub>,3<,/sub>,n TRAM TEGs,n atomic movement enhancement,n charge-injection phase change memory,n electrical measurement,n electron injection,n fast threshold switching,n hole generation,n switchi
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    Investigation of the textile structures with different design used in electromagnetic shielding

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contributor authorApreutesei, Alina - Lacramioara
contributor authorCurteza, Antonela
contributor authorDavid, Valeriu
contributor authorNica, Ionut
contributor authorRau, Miuta
contributor authorBaltag, Octavian
date accessioned2020-03-12T21:59:43Z
date available2020-03-12T21:59:43Z
date issued2014
identifier other6969979.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1067758
formatgeneral
languageEnglish
publisherIEEE
titleInvestigation of the textile structures with different design used in electromagnetic shielding
typeConference Paper
contenttypeMetadata Only
identifier padid8202586
subject keywordsantimony compounds
subject keywordsn charge injection
subject keywordsn germanium compounds
subject keywordsn phase change memories
subject keywordsn semiconductor superlattices
subject keywordsn transient analysis
subject keywordsn 1R test structure analysis
subject keywordsn AC transient analysis
subject keywordsn DC sweep analysis
subject keywordsn GeTe-Sb<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywordsTe<
subject keywordssub>
subject keywords3<
subject keywords/sub>
subject keywordsn TRAM TEGs
subject keywordsn atomic movement enhancement
subject keywordsn charge-injection phase change memory
subject keywordsn electrical measurement
subject keywordsn electron injection
subject keywordsn fast threshold switching
subject keywordsn hole generation
subject keywordsn switchi
identifier doi10.1109/ICMTS.2014.6841464
journal titlelectrical and Power Engineering (EPE), 2014 International Conference and Exposition on
filesize1046534
citations0
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