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Nanochannel electrical immunosensor for cancer stem cell proteomic biomarker based classification of breast cancer

Author:
Selvam, Anjan Panneer
,
Kumar, Anupam
,
Prasad, Shalini
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICICDT.2014.6838598
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1066618
Keyword(s): MOSFET,n high-k dielectric thin films,n plasma materials processing,n random noise,n semiconductor device noise,n silicon compounds,n statistical distributions,n ICP,n MOSFETs,n PCD,n RTN characteristics,n SiO<,sub>,2<,/sub>,n argon gas,n carrier capture,n carrier emission,n high-k gate dielectric,n inductively coupled plasma,n plasma-induced charging damage,n power spectral density,n random telegraph noise,n statistical distri
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    Nanochannel electrical immunosensor for cancer stem cell proteomic biomarker based classification of breast cancer

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contributor authorSelvam, Anjan Panneer
contributor authorKumar, Anupam
contributor authorPrasad, Shalini
date accessioned2020-03-12T21:57:48Z
date available2020-03-12T21:57:48Z
date issued2014
identifier other6968151.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1066618?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleNanochannel electrical immunosensor for cancer stem cell proteomic biomarker based classification of breast cancer
typeConference Paper
contenttypeMetadata Only
identifier padid8200743
subject keywordsMOSFET
subject keywordsn high-k dielectric thin films
subject keywordsn plasma materials processing
subject keywordsn random noise
subject keywordsn semiconductor device noise
subject keywordsn silicon compounds
subject keywordsn statistical distributions
subject keywordsn ICP
subject keywordsn MOSFETs
subject keywordsn PCD
subject keywordsn RTN characteristics
subject keywordsn SiO<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywordsn argon gas
subject keywordsn carrier capture
subject keywordsn carrier emission
subject keywordsn high-k gate dielectric
subject keywordsn inductively coupled plasma
subject keywordsn plasma-induced charging damage
subject keywordsn power spectral density
subject keywordsn random telegraph noise
subject keywordsn statistical distri
identifier doi10.1109/ICICDT.2014.6838598
journal titleanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
filesize573903
citations0
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