Session MW: Microw ave and millimeter wave devices, circuits & microsystems
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سال
: 2014شناسه الکترونیک: 10.1109/AERO.2014.6836193
کلیدواژه(گان): aerospace testing,n fault diagnosis,n jet engines,n measurement systems,n pattern clustering,n sensors,n algorithmic correction scheme,n autoadaptive clusterisation algorithm,n calibration,n context variation compensation,n development testing,n fault diagnosis,n fault pattern detection,n frequency response,n harness intermittency failure,n model parameter evolution analysis,n robust monitoring,n sensor measurement,n time dependent model
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Session MW: Microw ave and millimeter wave devices, circuits & microsystems
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date accessioned | 2020-03-12T21:56:25Z | |
date available | 2020-03-12T21:56:25Z | |
date issued | 2014 | |
identifier other | 6966420.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1065846 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Session MW: Microw ave and millimeter wave devices, circuits & microsystems | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8199496 | |
subject keywords | aerospace testing | |
subject keywords | n fault diagnosis | |
subject keywords | n jet engines | |
subject keywords | n measurement systems | |
subject keywords | n pattern clustering | |
subject keywords | n sensors | |
subject keywords | n algorithmic correction scheme | |
subject keywords | n autoadaptive clusterisation algorithm | |
subject keywords | n calibration | |
subject keywords | n context variation compensation | |
subject keywords | n development testing | |
subject keywords | n fault diagnosis | |
subject keywords | n fault pattern detection | |
subject keywords | n frequency response | |
subject keywords | n harness intermittency failure | |
subject keywords | n model parameter evolution analysis | |
subject keywords | n robust monitoring | |
subject keywords | n sensor measurement | |
subject keywords | n time dependent model | |
identifier doi | 10.1109/AERO.2014.6836193 | |
journal title | emiconductor Conference (CAS), 2014 International | |
filesize | 47438 | |
citations | 0 |