Show simple item record

A new method based on wavelet and greedy pusuit analysis for neuro-spike detection

contributor authorJunwei Duan
contributor authorLong Chen
contributor authorChen, C.L.Philip
date accessioned2020-03-12T21:51:38Z
date available2020-03-12T21:51:38Z
date issued2014
identifier other6961819.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1063074?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleA new method based on wavelet and greedy pusuit analysis for neuro-spike detection
typeConference Paper
contenttypeMetadata Only
identifier padid8195160
subject keywordscircuit reliability
subject keywordsn contamination
subject keywordsn copper alloys
subject keywordsn corrosion testing
subject keywordsn creep testing
subject keywordsn metallisation
subject keywordsn printed circuit testing
subject keywordsn silver alloys
subject keywordsn sulphur
subject keywordsn Ag
subject keywordsn Cu
subject keywordsn FOS based qualification test
subject keywordsn FOS chamber performance
subject keywordsn International Electronics Manufacturing Initiative
subject keywordsn MFG
subject keywordsn PCBs
subject keywordsn S
subject keywordsn air velocity effect
subject keywordsn board surfaces
subject keywordsn contaminants
subject keywordsn copper corrosion rates
subject keywordsn copper creep corrosion
subject keywordsn copper foils
subject keywordsn copper metallizat
identifier doi10.1109/ICEP.2014.6826688
journal titlenformative and Cybernetics for Computational Social Systems (ICCSS), 2014 International Conference o
filesize476576
citations0


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record