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Single Sensor Blind Time-Frequency Activity Estimation of a Mixture of Radio Signals via CP Tensor Decomposition

Author:
Mueller-Smith, Christopher
,
Spasojevic, Predrag
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/EuroSimE.2014.6813820
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1059172
Keyword(s): adhesive bonding,n creep testing,n fatigue,n reliability,n silver,n tensile testing,n thermal expansion,n ABAQUS 20 model,n Ag,n CTE,n bi-material bonding,n coefficient of thermal expansion,n creep tests,n die attachment reliability,n electronic assembly,n epoxy based adhesives,n fatigue life,n glass-amorphous behaviour,n isotropic conductive adhesive,n life prediction,n microelectronic components,n on-ground test temperatures,n s
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    Single Sensor Blind Time-Frequency Activity Estimation of a Mixture of Radio Signals via CP Tensor Decomposition

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contributor authorMueller-Smith, Christopher
contributor authorSpasojevic, Predrag
date accessioned2020-03-12T21:45:09Z
date available2020-03-12T21:45:09Z
date issued2014
identifier other6956830.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1059172?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleSingle Sensor Blind Time-Frequency Activity Estimation of a Mixture of Radio Signals via CP Tensor Decomposition
typeConference Paper
contenttypeMetadata Only
identifier padid8190692
subject keywordsadhesive bonding
subject keywordsn creep testing
subject keywordsn fatigue
subject keywordsn reliability
subject keywordsn silver
subject keywordsn tensile testing
subject keywordsn thermal expansion
subject keywordsn ABAQUS 20 model
subject keywordsn Ag
subject keywordsn CTE
subject keywordsn bi-material bonding
subject keywordsn coefficient of thermal expansion
subject keywordsn creep tests
subject keywordsn die attachment reliability
subject keywordsn electronic assembly
subject keywordsn epoxy based adhesives
subject keywordsn fatigue life
subject keywordsn glass-amorphous behaviour
subject keywordsn isotropic conductive adhesive
subject keywordsn life prediction
subject keywordsn microelectronic components
subject keywordsn on-ground test temperatures
subject keywordsn s
identifier doi10.1109/EuroSimE.2014.6813820
journal titleilitary Communications Conference (MILCOM), 2014 IEEE
filesize261923
citations0
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