Power consumption evaluation in random cellular networks
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Year
: 2014DOI: 10.7873/DATE.2014.207
Keyword(s): VLSI,n built-in self test,n design for testability,n fuzzy set theory,n integrated circuit testing,n BIST,n FE sub-blocks,n PUF-based secure key storage circuit testing,n SAF,n VLSI chip,n built-in self-test,n design for testability,n fuzzy extractor,n high stuck-at-fault,n physical unclonable function based systems,n scan-chain free functional testing,n test circuitry,n Circuit faults,n Clocks,n Cryptography,n Decoding,n Error corre
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Power consumption evaluation in random cellular networks
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| contributor author | Ge, Xiaohu | |
| contributor author | Song, Peipei | |
| contributor author | Taleb, Tarik | |
| contributor author | Han, Tao | |
| contributor author | Zhang, Jing | |
| contributor author | Li, Qiang | |
| date accessioned | 2020-03-12T21:40:23Z | |
| date available | 2020-03-12T21:40:23Z | |
| date issued | 2014 | |
| identifier other | 6953031.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1056508?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Power consumption evaluation in random cellular networks | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8187563 | |
| subject keywords | VLSI | |
| subject keywords | n built-in self test | |
| subject keywords | n design for testability | |
| subject keywords | n fuzzy set theory | |
| subject keywords | n integrated circuit testing | |
| subject keywords | n BIST | |
| subject keywords | n FE sub-blocks | |
| subject keywords | n PUF-based secure key storage circuit testing | |
| subject keywords | n SAF | |
| subject keywords | n VLSI chip | |
| subject keywords | n built-in self-test | |
| subject keywords | n design for testability | |
| subject keywords | n fuzzy extractor | |
| subject keywords | n high stuck-at-fault | |
| subject keywords | n physical unclonable function based systems | |
| subject keywords | n scan-chain free functional testing | |
| subject keywords | n test circuitry | |
| subject keywords | n Circuit faults | |
| subject keywords | n Clocks | |
| subject keywords | n Cryptography | |
| subject keywords | n Decoding | |
| subject keywords | n Error corre | |
| identifier doi | 10.7873/DATE.2014.207 | |
| journal title | ireless Communications and Networking Conference (WCNC), 2014 IEEE | |
| filesize | 206440 | |
| citations | 0 |