Show simple item record

Superior performance and Hot Carrier reliability of Strained FDSOI nMOSFETs for advanced CMOS technology nodes

contributor authorBesnard, G.
contributor authorGarros, X.
contributor authorAndrieu, F.
contributor authorNguyen, P.
contributor authorVan Den Daele, W.
contributor authorReynaud, P.
contributor authorSchwarzenbach, W.
contributor authorDelprat, D.
contributor authorBourdelle, K.K.
contributor authorReimbold, G.
contributor authorCristoloveanu, S.
date accessioned2020-03-12T21:36:01Z
date available2020-03-12T21:36:01Z
date issued2014
identifier other6948801.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1054124?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleSuperior performance and Hot Carrier reliability of Strained FDSOI nMOSFETs for advanced CMOS technology nodes
typeConference Paper
contenttypeMetadata Only
identifier padid8184639
subject keywordsmedical image processing
subject keywordsn program compilers
subject keywordsn code optimization
subject keywordsn code optimization techniques
subject keywordsn compiler optimization techniques
subject keywordsn constant folding technique
subject keywordsn execution time performance
subject keywordsn image acceleration techniques
subject keywordsn image processing algorithms
subject keywordsn image sizes
subject keywordsn loop fusion technique
subject keywordsn medical image processing
subject keywordsn operating systems
subject keywordsn processors
subject keywordsn Conferences
subject keywordsn DVD
subject keywordsn Decision support systems
subject keywordsn Handheld computers
subject keywordsn Code Optimization
subject keywordsn Imag
identifier doi10.1109/IAdCC.2014.6779413
journal titleolid State Device Research Conference (ESSDERC), 2014 44th European
filesize2910639
citations1


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record