The effect of X-Ray radiation dose rate on Triple-Gate SOI FinFETs parameters
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سال
: 2014شناسه الکترونیک: 10.1109/PSCC.2014.7038317
کلیدواژه(گان): Accuracy,Damping,Kernel,Oscillators,Security,Support vector machines,Training,evolution strategies,inter-area oscillations,support vector machines,wide-area monitoring systems
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آمار بازدید
The effect of X-Ray radiation dose rate on Triple-Gate SOI FinFETs parameters
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| contributor author | Bordallo, C.C.M. | |
| contributor author | Teixeira, F.F. | |
| contributor author | Silveira, M.A.G. | |
| contributor author | Martino, J.A. | |
| contributor author | Agopian, P.G.D. | |
| contributor author | Simoen, E. | |
| contributor author | Claeys, C. | |
| date accessioned | 2020-03-12T21:23:35Z | |
| date available | 2020-03-12T21:23:35Z | |
| date issued | 2014 | |
| identifier other | 6940085.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1047501?locale-attribute=fa | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | The effect of X-Ray radiation dose rate on Triple-Gate SOI FinFETs parameters | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8176653 | |
| subject keywords | Accuracy | |
| subject keywords | Damping | |
| subject keywords | Kernel | |
| subject keywords | Oscillators | |
| subject keywords | Security | |
| subject keywords | Support vector machines | |
| subject keywords | Training | |
| subject keywords | evolution strategies | |
| subject keywords | inter-area oscillations | |
| subject keywords | support vector machines | |
| subject keywords | wide-area monitoring systems | |
| identifier doi | 10.1109/PSCC.2014.7038317 | |
| journal title | icroelectronics Technology and Devices (SBMicro), 2014 29th Symposium on | |
| filesize | 1065137 | |
| citations | 0 |