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Novel submicron process development tool for SAW device fabrication

contributor authorJacobs, J.
contributor authorDufilie, P.
date accessioned2020-03-12T21:16:38Z
date available2020-03-12T21:16:38Z
date issued2014
identifier other6932291.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1043192?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleNovel submicron process development tool for SAW device fabrication
typeConference Paper
contenttypeMetadata Only
identifier padid8171142
subject keywordsapplication program interfaces
subject keywordsautomatic testing
subject keywordsavionics
subject keywordsconformance testing
subject keywordsformal specification
subject keywordslocal area networks
subject keywordsoperating systems (computers)
subject keywordsprogram testing
subject keywordsprogram verification
subject keywordsprotocols
subject keywordspublic domain software
subject keywordssafety-critical software
subject keywordssoftware reliability
subject keywordsAFDX
subject keywordsARINC 653 Part 3 conformity test specification
subject keywordsARINC 653 based RTOS validation
subject keywordsARINC 653 conformance
subject keywordsARINC 653 specification
subject keywordsARINC 653 verification suites
subject keywordsAvionics Full-Duplex Switched Ethernet Network
subject keywordsCI princ
identifier doi10.1109/DASC.2014.6979534
journal titleltrasonics Symposium (IUS), 2014 IEEE International
filesize4436320
citations0


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