A terahertz chemical microscopy for an agar culture medium
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Year
: 2014DOI: 10.1109/EPTC.2014.7028394
Keyword(s): Aluminum,Diffraction,Grain size,Silicon,Substrates,Surface topography,Surface treatment
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A terahertz chemical microscopy for an agar culture medium
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| contributor author | Nino, H. | |
| contributor author | Nakamura, A. | |
| contributor author | Omura, K. | |
| contributor author | Sakai, K. | |
| contributor author | Kiwa, T. | |
| contributor author | Tsukada, K. | |
| date accessioned | 2020-03-12T21:13:28Z | |
| date available | 2020-03-12T21:13:28Z | |
| date issued | 2014 | |
| identifier other | 6930088.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1041309?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | A terahertz chemical microscopy for an agar culture medium | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8168650 | |
| subject keywords | Aluminum | |
| subject keywords | Diffraction | |
| subject keywords | Grain size | |
| subject keywords | Silicon | |
| subject keywords | Substrates | |
| subject keywords | Surface topography | |
| subject keywords | Surface treatment | |
| identifier doi | 10.1109/EPTC.2014.7028394 | |
| journal title | eneral Assembly and Scientific Symposium (URSI GASS), 2014 XXXIth URSI | |
| filesize | 934777 | |
| citations | 0 |