A Thread Behavior-Based Memory Management Framework on Multi-core Smartphone
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: 2014DOI: 10.1109/DEIV.2014.6961767
Keyword(s): SF<,sub>,6<,/sub>,insulation,electric breakdown,electrodes,power supplies to apparatus,reliability,spark gaps,statistical distributions,DC accelerators,SF<,sub>,6<,/sub>,environment,automated qualification,automated shutdown circuit,automatic breakdown analysis,breakdown voltage,dielectric medium,distance 5 mm,electrical performance,electrodes,electron volt energy 3 MeV,flyback topology,high voltage multiplier column,high voltage power supply,maximum rating
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A Thread Behavior-Based Memory Management Framework on Multi-core Smartphone
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| contributor author | Zongwei Zhu | |
| contributor author | Xi Li | |
| contributor author | Hengchang Liu | |
| contributor author | Cheng Ji | |
| contributor author | Yuan Xu | |
| contributor author | Xuehai Zhou | |
| contributor author | Beilei Sun | |
| date accessioned | 2020-03-12T21:04:02Z | |
| date available | 2020-03-12T21:04:02Z | |
| date issued | 2014 | |
| identifier other | 6923123.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1035791?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | A Thread Behavior-Based Memory Management Framework on Multi-core Smartphone | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8161896 | |
| subject keywords | SF< | |
| subject keywords | sub> | |
| subject keywords | 6< | |
| subject keywords | /sub> | |
| subject keywords | insulation | |
| subject keywords | electric breakdown | |
| subject keywords | electrodes | |
| subject keywords | power supplies to apparatus | |
| subject keywords | reliability | |
| subject keywords | spark gaps | |
| subject keywords | statistical distributions | |
| subject keywords | DC accelerators | |
| subject keywords | SF< | |
| subject keywords | sub> | |
| subject keywords | 6< | |
| subject keywords | /sub> | |
| subject keywords | environment | |
| subject keywords | automated qualification | |
| subject keywords | automated shutdown circuit | |
| subject keywords | automatic breakdown analysis | |
| subject keywords | breakdown voltage | |
| subject keywords | dielectric medium | |
| subject keywords | distance 5 mm | |
| subject keywords | electrical performance | |
| subject keywords | electrodes | |
| subject keywords | electron volt energy 3 MeV | |
| subject keywords | flyback topology | |
| subject keywords | high voltage multiplier column | |
| subject keywords | high voltage power supply | |
| subject keywords | maximum rating | |
| identifier doi | 10.1109/DEIV.2014.6961767 | |
| journal title | ngineering of Complex Computer Systems (ICECCS), 2014 19th International Conference on | |
| filesize | 1952211 | |
| citations | 1 |