A pattern recognition for group abnormal behaviors based on Markov Random Fields energy
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: 2014DOI: 10.1109/ISICIR.2014.7029583
Keyword(s): Abstracts,Computer bugs,Educational institutions,Electrical engineering,Multicore processing,Silicon,System-on-chip,electrical bug,logic bugs,post-silicon validation,silicon debug,verification
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A pattern recognition for group abnormal behaviors based on Markov Random Fields energy
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| contributor author | Li Zuojin | |
| contributor author | Chen Liukui | |
| contributor author | Ren Zhiyong | |
| contributor author | Tirumala, S.S. | |
| date accessioned | 2020-03-12T21:02:02Z | |
| date available | 2020-03-12T21:02:02Z | |
| date issued | 2014 | |
| identifier other | 6921511.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1034622?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | A pattern recognition for group abnormal behaviors based on Markov Random Fields energy | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8160548 | |
| subject keywords | Abstracts | |
| subject keywords | Computer bugs | |
| subject keywords | Educational institutions | |
| subject keywords | Electrical engineering | |
| subject keywords | Multicore processing | |
| subject keywords | Silicon | |
| subject keywords | System-on-chip | |
| subject keywords | electrical bug | |
| subject keywords | logic bugs | |
| subject keywords | post-silicon validation | |
| subject keywords | silicon debug | |
| subject keywords | verification | |
| identifier doi | 10.1109/ISICIR.2014.7029583 | |
| journal title | ognitive Informatics & Cognitive Computing (ICCI*CC), 2014 IEEE 13th International Conferenc | |
| filesize | 478679 | |
| citations | 0 |