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Structural damage of Si-implanted in the In<inf>0.53</inf>Ga<inf>0.47</inf>As thin film

date accessioned2020-03-12T21:01:00Z
date available2020-03-12T21:01:00Z
date issued2014
identifier other6920842.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1034021?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleStructural damage of Si-implanted in the In<inf>0.53</inf>Ga<inf>0.47</inf>As thin film
typeConference Paper
contenttypeMetadata Only
identifier padid8159845
subject keywordsAntenna radiation patterns
subject keywordsBandwidth
subject keywordsBroadband antennas
subject keywordsDipole antennas
subject keywordsFeeds
subject keywordsGain
subject keywordsImpedance matching
subject keywordsdipole antenna
subject keywordsdual-polarized antenna
subject keywordsmicrostrip balun
identifier doi10.1109/ISANP.2014.7026796
journal titleemiconductor Electronics (ICSE), 2014 IEEE International Conference on
filesize1501959
citations0
contributor rawauthorRoslan, Muhammad Zulkhairi , Berhanuddin, Dilla D. , Mohamed, Mohd Ambri , Wee, M.F.Mohd Razip , Larki, Farhad , Majlis, Burhanuddin Yeop


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