A New Perspective on Material Classification and Ink Identification
Publisher:
Year
: 2014DOI: 10.1109/ICIP.2014.7025961
Keyword(s): Level measurement,Pattern recognition,Prototypes,Robustness,Shape,Shape measurement,DCE,Partial matching,elastic deformations,elastic shape similarity measure,geodesics
Collections
:
-
Statistics
A New Perspective on Material Classification and Ink Identification
Show full item record
| date accessioned | 2020-03-12T20:51:11Z | |
| date available | 2020-03-12T20:51:11Z | |
| date issued | 2014 | |
| identifier other | 6909688.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1027900?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | A New Perspective on Material Classification and Ink Identification | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8153025 | |
| subject keywords | Level measurement | |
| subject keywords | Pattern recognition | |
| subject keywords | Prototypes | |
| subject keywords | Robustness | |
| subject keywords | Shape | |
| subject keywords | Shape measurement | |
| subject keywords | DCE | |
| subject keywords | Partial matching | |
| subject keywords | elastic deformations | |
| subject keywords | elastic shape similarity measure | |
| subject keywords | geodesics | |
| identifier doi | 10.1109/ICIP.2014.7025961 | |
| journal title | omputer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on | |
| filesize | 1582558 | |
| citations | 0 | |
| contributor rawauthor | Shiradkar, Rakesh , Shen, Li , Landon, George , Ong, Sim Heng , Tan, Ping |